5 papers
Structural analysis of co-sputtered Cu-Nb and Cu-Pd textured thin films
Claudia Cancellieri, Giacomo Lorenzin, Yeliz Unutulmazsoy +2
Structural characterization of nanoscale-two-metal-phase systems, which exhibit partial, complete, or no mixing when co-sputtered with a few percent of a minority element, is extre…
Bridging classical and quantum interpretation of chemical state analysis by XPS/HAXPES to resolve short-range order in amorphous alumina films
Simon Gramatte, Xing Wang, Michael Alejandro Hernández Bertrán +8
Probing the local structure and chemistry of wide-bandgap amorphous oxide thin films remains challenging due to the limitations of lab-based spectroscopy. This work integrates X-ra…
Auger parameter analysis for TiN and AlN thin films via combined in-situ XPS and HAXPES
O. V. Pshyk, J. Patidar, C. Cancellieri +1
Auger parameter analysis provides in-depth information about the electronic and chemical bonding properties of TiN and AlN thin films, which are relevant across a wide range of tec…
Refining interface stress measurement in nanomultilayers through layer corrugation and interface roughness corrections
Yang Hu, Aleksandr Druzhinin, Claudia Cancellieri +1
We introduce new models that incorporate layer corrugation and interface roughness into standard approaches for measuring interface stress in nanomultilayers (NMLs). Applied to Cu/…
Computationally-guided discovery and synthesis of the amorphous nitride Y2WN4
O. V. Pshyk, S. Zhuk, J. Patidar +6
Amorphous materials offer unique functional characteristics, which are often not observed in their crystalline counterparts. This makes them invaluable for many technological appli…