Rietveld refinement and electron density distribution in CuxV2O5

R. Nithya, Sharat Chandra, G. L. N. Reddy +2

Room temperature powder x-ray diffraction measurements have been carried out on polycrystalline samples of CuxV2O5 with x = 0.33, 0.40, 0.50, 0.55 and 0.60, prepared by solid state…