4 citations · 5 across the 2 of their papers we have counts for
2 papers
physics.chem-ph2024★ 4 cited
A systematic study to investigate the effects of X-ray exposure on electrical properties of silicon dioxide thin films using X-ray photoelectron spectroscopy
Carlos Munoz, Thomas Iken, Nuri Oncel
X-ray Photoelectron Spectroscopy (XPS) is generally used for chemical analysis of surfaces and interfaces. This method involves the analysis of changes in binding energies and peak…
physics.app-ph2024★ 1 cited
Probing Electrical Properties of A Silicon Nanocrystal Thin Film Using X-ray Photoelectron Spectroscopy
Amrit Laudari, Sameera Pathiranage, Salim A. Thomas +5
We performed X-ray photoelectron spectroscopy (XPS) measurements on a thin film of Si nanocrystals (SiNCs) while applying DC or AC external biases to extract the resistance and the…