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cs.CV2025
Are Foundation Models Ready for Industrial Defect Recognition? A Reality Check on Real-World Data
Simon Baeuerle, Pratik Khanna, Nils Friederich +4
Foundation Models (FMs) have shown impressive performance on various text and image processing tasks. They can generalize across domains and datasets in a zero-shot setting. This c…
cs.CV2024
Iterative Cluster Harvesting for Wafer Map Defect Patterns
Alina Pleli, Simon Baeuerle, Michel Janus +3
Unsupervised clustering of wafer map defect patterns is challenging because the appearance of certain defect patterns varies significantly. This includes changing shape, location,…