most citedExact analytical solution for electrostatic field produced by biased atomic force microscope tip dwelling above dielectric-conductor bi-layer

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cond-mat.mtrl-sci2004★ 1 cited

Exact analytical solution for electrostatic field produced by biased atomic force microscope tip dwelling above dielectric-conductor bi-layer

Sergei F. Lyuksyutov, Ruslan A. Sharipov, Grigori Sigalov +1

An exact analytical solution based on the method of images has been obtained for the description of the electrostatic field in the system comrising of atomic force microscope (AFM)…