194 citations · 396 across the 7 of their papers we have counts for
7 papers
One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories
Christian Acal, Juan Eloy Ruiz-Castro, David Maldonado +1
A new probability distribution to study lifetime data in reliability is introduced in this paper. This one is a first approach to a non-homogeneous phase-type distribution. It is b…
An approach to non-homogenous phase-type distributions through multiple cut-points
Juan Eloy Ruiz-Castro, Christian Acal, Juan B. Roldán
A new class of distributions based on phase-type distributions is introduced in the current paper to model lifetime data in the field of reliability analysis. This one is the natur…
Stochastic resonance in a metal-oxide memristive device
A. N. Mikhaylov, D. V. Guseinov, A. I. Belov +13
The stochastic resonance phenomenon has been studied experimentally and theoretically for a state-of-art metal-oxide memristive device based on yttria-stabilized zirconium dioxide…
Modeling the variability of memristive devices with hexagonal boron nitride as dielectric
Juan B. Roldan, David Maldonado, C. Aguilera-Pedregosa +6
Variability in memristive devices based on h-BN dielectrics is studied in depth. Different numerical techniques to extract the reset voltage are described and the corresponding cyc…
Variability in Resistive Memories
Juan B. Roldán, Enrique Miranda, David Maldonado +17
Resistive memories are outstanding electron devices that have displayed a large potential in a plethora of applications such as nonvolatile data storage, neuromorphic computing, ha…
Phase-type distributions for studying variability in resistive memories
Christian Acal, Juan E. Ruiz-Castro, Ana M. Aguilera +2
A new statistical approach has been developed to analyze Resistive Random Access Memory (RRAM) variability. The stochastic nature of the physical processes behind the operation of…
Semiempirical Modeling of Reset Transitions in Unipolar Resistive-Switching Based Memristors
Rodrigo Picos, Juan Bautista Roldan, Mohamed Moner Al Chawa +3
We have measured the transition process from the high to low resistivity states, i.e., the reset process of resistive switching based memristors based on Ni/HfO2/Si-n+ structures,…