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cond-mat.soft2020
Prospects for the Use of Laboratory Sources for X-ray Reflectometry of Thin Films on a Liquid Surface
Viktor E. Asadchikov, Yuri O. Volkov, Alexander D. Nuzhdin +2
The authors present a review of the systematic studies of the structure of macroscopically planar thin films at the air-liquid interface (water, alkali solution and silica hydrosol…
cond-mat.soft2020★ 3 cited
Synchrotron X-Ray Reflectivity Study of the Adsorption Film of Octadecanamide at the Toluene-Water Interface
Aleksey M. Tikhonov, Yurii O. Volkov
The structure of an adsorption octadecanamide film at the planar toluene-water interface is studied by X-ray reflectometry using synchrotron radiation with photon energy of 15 keV.…