activity
20162026
most citedElectron-Beam Manipulation of Silicon Dopants in Graphene

122 citations · 641 across the 11 of their papers we have counts for

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Showing 2018Show all

5 papers · 1 filter

cond-mat.mtrl-sci2018★ 22 cited

Intrinsic core level photoemission of suspended graphene

Toma Susi, Mattia Scardamaglia, Kimmo Mustonen +11

X-ray photoelectron spectroscopy of graphene is important both for its characterization and as a model for other carbon materials. Despite great recent interest, the intrinsic phot…

physics.app-ph2018

Revealing the 3D Structure of Graphene Defects

Christoph Hofer, Christian Kramberger, Mohammad Reza Ahmadpour Monazam +5

We demonstrate insights into the three-dimensional structure of defects in graphene, in particular grain boundaries, obtained via a new approach from two transmission electron micr…

cond-mat.mes-hall2018

Analysis of point defects in graphene using low dose scanning transmission electron microscopy imaging and maximum likelihood reconstruction

Christian Kramberger, Andreas Mittelberger, Christoph Hofer +1

Freestanding graphene displays an outstanding resilience to electron irradiation at low electron energies. Point defects in graphene are, however, subject to beam driven dynamics.…

cond-mat.mtrl-sci2018★ 15 cited

Automated image acquisition for low-dose STEM at atomic resolution

Andreas Mittelberger, Christian Kramberger, Christoph Hofer +2

Beam damage is a major limitation in electron microscopy that becomes increasingly severe at higher resolution. One possible route to circumvent radiation damage, which forms the b…

cond-mat.mtrl-sci2018★ 23 cited

Insights into radiation damage from atomic resolution scanning transmission electron microscopy imaging of mono-layer CuPcCl films on graphene

Andreas Mittelberger, Christian Kramberger, Jannik C. Meyer

Atomically resolved images of monolayer organic crystals have only been obtained with scanning probe methods so far. On the one hand, they are usually prepared on surfaces of bulk…