275 citations · 2.5k across the 54 of their papers we have counts for
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Chemistry at graphene edges in the electron microscope
Gregor T. Leuthner, Toma Susi, Clemens Mangler +2
Transmission electron microscopy (TEM) and scanning TEM (STEM) are indispensable tools for materials characterization. However, during a typical (S)TEM experiment, the sample is su…
Interferometric 4D-STEM for Lattice Distortion and Interlayer Spacing Measurements in Bilayer and Trilayer Two-dimensional Materials
Michael J Zachman, Jacob Madsen, Xiang Zhang +3
Van der Waals materials composed of stacks of individual atomic layers have attracted considerable attention due to their exotic electronic properties that can be altered by, for e…
description of bonding for transmission electron microscopy
Jacob Madsen, Timothy J. Pennycook, Toma Susi
The simulation of transmission electron microscopy (TEM) images or diffraction patterns is often required to interpret their contrast and extract specimen features. This is especia…
Single indium atoms and few-atom indium clusters anchored onto graphene via silicon heteroatoms
Kenan Elibol, Clemens Mangler, David D. O'Regan +7
Single atoms and few-atom nanoclusters are of high interest in catalysis and plasmonics, but pathways for their fabrication and stable placement remain scarce. We report here the s…