179 citations · 434 across the 8 of their papers we have counts for
17 papers · 1 filter
Mechanism of electron-beam manipulation of single dopant atoms in silicon
Alexander Markevich, Bethany M Hudak, Jacob Madsen +4
The precise positioning of dopant atoms within bulk crystal lattices could enable novel applications in areas including solid-state sensing and quantum computation. Established sca…
Chemistry at graphene edges in the electron microscope
Gregor T. Leuthner, Toma Susi, Clemens Mangler +2
Transmission electron microscopy (TEM) and scanning TEM (STEM) are indispensable tools for materials characterization. However, during a typical (S)TEM experiment, the sample is su…
Interferometric 4D-STEM for Lattice Distortion and Interlayer Spacing Measurements in Bilayer and Trilayer Two-dimensional Materials
Michael J Zachman, Jacob Madsen, Xiang Zhang +3
Van der Waals materials composed of stacks of individual atomic layers have attracted considerable attention due to their exotic electronic properties that can be altered by, for e…
description of bonding for transmission electron microscopy
Jacob Madsen, Timothy J. Pennycook, Toma Susi
The simulation of transmission electron microscopy (TEM) images or diffraction patterns is often required to interpret their contrast and extract specimen features. This is especia…
Perforating freestanding molybdenum disulfide monolayers with highly charged ions
Roland Kozubek, Mukesh Tripathi, Mahdi Ghorbani-Asl +12
Porous single layer molybdenum disulfide (MoS) is a promising material for applications such as DNA sequencing and water desalination. In this work, we introduce irradiation wi…
Electron-Beam Manipulation of Silicon Impurities in Single-Walled Carbon Nanotubes
Kimmo Mustonen, Alexander Markevich, Mukesh Tripathi +7
The recent discovery that impurity atoms in crystals can be manipulated with focused electron irradiation has opened novel perspectives for top-down atomic engineering. These achie…