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cs.CV2026
Lighting-aware Unified Model for Instance Segmentation
Qisai Liu, Alloy Das, Zhanhong Jiang +4
Foundation models like the Segment Anything Model (SAM) demonstrate impressive zero-shot generalization but frequently degrade under diverse real-world illumination, particularly f…
cs.CV2026
Artifact Removal and Image Restoration in AFM:A Structured Mask-Guided Directional Inpainting Approach
Juntao Zhang, Angona Biswas, Jaydeep Rade +5
Atomic Force Microscopy (AFM) enables high-resolution surface imaging at the nanoscale, yet the output is often degraded by artifacts introduced by environmental noise, scanning im…