activity
20102023
most citedResonant carbon K-edge soft x-ray scattering from lattice-free heliconical molecular ordering: soft dilative elasticity of the twist-bend liquid crystal phase

183 citations · 288 across the 9 of their papers we have counts for

collaborators

9 papers

cs.CV2023

DLSIA: Deep Learning for Scientific Image Analysis

Eric J Roberts, Tanny Chavez, Alexander Hexemer +1

We introduce DLSIA (Deep Learning for Scientific Image Analysis), a Python-based machine learning library that empowers scientists and researchers across diverse scientific domains…

cond-mat.mtrl-sci2022★ 1 cited

A Continuous Action Space Tree search for INverse desiGn (CASTING) Framework for Materials Discovery

Suvo Banik, Troy Loefller, Sukriti Manna +5

Fast and accurate prediction of optimal crystal structure, topology, and microstructures is important for accelerating the design and discovery of new materials. A challenge lies i…

cs.LG2022★ 9 cited

MLExchange: A web-based platform enabling exchangeable machine learning workflows for scientific studies

Zhuowen Zhao, Tanny Chavez, Elizabeth A. Holman +14

Machine learning (ML) algorithms are showing a growing trend in helping the scientific communities across different disciplines and institutions to address large and diverse data p…

eess.IV2020★ 1 cited

Real-time sparse-sampled Ptychographic imaging through deep neural networks

Mathew J. Cherukara, Tao Zhou, Youssef Nashed +4

Ptychography has rapidly grown in the fields of X-ray and electron imaging for its unprecedented ability to achieve nano or atomic scale resolution while simultaneously retrieving…

physics.chem-ph2019★ 2 cited

A Multi-Resolution 3D-DenseNet for Chemical Shift Prediction in NMR Crystallography

Shuai Liu, Jie Li, Kochise C. Bennett +6

We have developed a deep learning algorithm for chemical shift prediction for atoms in molecular crystals that utilizes an atom-centered Gaussian density model for the 3D data repr…

cond-mat.mtrl-sci2017★ 23 cited

On-the-fly Data Assessment for High Throughput X-ray Diffraction Measurement

Fang Ren, Ronald Pandolfi, Douglas Van Campen +2

Investment in brighter sources and larger and faster detectors has accelerated the speed of data acquisition at national user facilities. The accelerated data acquisition offers ma…