2 papers
physics.acc-ph2025
Accurate Modelling of Intrabeam Scattering and its Impact on Photoinjectors for Free-Electron Lasers
Thomas Geoffrey Lucas, Paolo Craievich, Eduard Prat +2
Intrabeam scattering (IBS) is a fundamental effect that can limit the performance of high-brightness electron machines, yet it has so far been neglected in standard modelling of RF…
physics.acc-ph2025
Femtosecond-Scale MeV-UED Beamline Using a Stand-Alone Multi-Cell RF Photogun
Thomas Geoffrey Lucas, Paolo Craievich, David Alesini +11
The temporal resolution of MeV ultrafast electron diffraction (UED) is fundamentally constrained by the electron bunch length at the sample, motivating the development of new elect…