2 papers
cs.CV2025
Automated Defect Detection for Mass-Produced Electronic Components Based on YOLO Object Detection Models
Wei-Lung Mao, Chun-Chi Wang, Po-Heng Chou +1
Since the defect detection of conventional industry components is time-consuming and labor-intensive, it leads to a significant burden on quality inspection personnel and makes it…
cs.NI2025
Markov Modeling for Licensed and Unlicensed Band Allocation in Underlay and Overlay D2D
Po-Heng Chou, Yen-Ting Liu, Wei-Chang Chen +1
In this paper, a novel analytical model for resource allocation is proposed for a device-to-device (D2D) assisted cellular network. The proposed model can be applied to underlay an…