activity
19992022
most citedHigh real-space resolution measurement of the local structure of Ga_1-xIn_xAs using x-ray diffraction

130 citations · 371 across the 14 of their papers we have counts for

collaborators

14 papers

cond-mat.mtrl-sci2022

Proper usage of Scherrer's and Guinier's formulas in X-ray analysis of size distribution in systems of monocrystalline CeO2 nanoparticles

Adriana Valério, Fabiane J. Trindade, Rafaela F. S. Penacchio +7

Small-angle X-ray scattering (SAXS) and X-ray diffraction (XRD) techniques are widely used as analytical tools in the optimization and control of nanomaterial synthesis processes.…

cond-mat.mtrl-sci2020

Morphology Control in van der Waals Epitaxy of Bismuth Telluride Topological Insulators

Celso I. Fornari, Eduardo Abramof, Paulo H. O. Rappl +2

Bismuth telluride have regained significant attention as a prototype of topological insulator. Thin films of high quality have been investigated as a basic platform for novel spint…

cond-mat.mtrl-sci2020

Hybrid reflections from multiple x-ray scattering in epitaxial bismuth telluride topological insulator films

Sergio L. Morelhao, Stefan Kycia, Samuel Netzke +3

Epitaxial films of bismuth telluride topological insulators have received increasing attention due to potential applications in spintronic and quantum computation. One of the most…

cond-mat.mtrl-sci2020★ 3 cited

Phonon Scattering Mechanism in Thermoelectric Materials Revised via Resonant X-ray Dynamical Diffraction

Adriana Valério, Rafaela F. S. Penacchio, Maurício B. Estradiote +7

Engineering of thermoelectric materials requires an understanding of thermal conduction by lattice and electronic degrees of freedom. Filled skutterudites denote a large family of…

cond-mat.mtrl-sci2019

Lateral lattice coherence lengths in thin films of bismuth telluride topological insulators, with overview on polarization factors for X-ray dynamical diffraction in monochromator crystals

Sergio L. Morelhao, Stefan Kycia, Samuel Netzke +3

In the supporting information file for article Dynamics of Defects in van der Waals Epitaxy of Bismuth Telluride Topological Insulators(J. Phys. Chem. C 2019, 123, 24818-24825, doi…

physics.app-ph2018

X-ray tools for van der Waals epitaxy of bismuth telluride topological insulator films

Stefan Kycia, Sergio L. Morelhao, Samuel Netzke +3

Potential applications in spintronics and quantum computing have motivated much recent research in epitaxial films of bismuth telluride. This system is also an example of van der W…