6 papers
Neutral but Impactful: Gallium Cluster-Induced Nanopores from Beam-Blanked Gallium Ion Sources
Dana O. Byrne, Stephanie M. Ribet, Karen C. Bustillo +2
Neutral atoms emitted from liquid metal ion sources are an often-overlooked source of contamination and damage in focused ion beam microscopy. Beyond ions and single atoms, these s…
Fabrication and characterization of boron-terminated tetravacancies in monolayer hBN using STEM, EELS and electron ptychography
Dana O. Byrne, Stephanie M. Ribet, Demie Kepaptsoglou +3
Tetravacancies in monolayer hexagonal boron nitride (hBN) with consistent edge termination (boron or nitrogen) form triangular nanopores with electrostatic potentials that can be l…
Focused helium ion beam nanofabrication by near-surface swelling
Sherry Mo, Dana O. Byrne, Frances I. Allen
The focused helium ion beam microscope is a versatile imaging and nanofabrication instrument enabling direct-write lithography with sub-10-nm resolution. Subsurface damage and swel…
Atomic Engineering of Triangular Nanopores in Monolayer hBN: A Decoupled Seeding and Growth Approach
Dana O. Byrne, Frances I. Allen
Nanopores in 2D materials are of significant interest in advanced membrane technologies aimed at the sensing and separation of ions and molecules. These applications necessitate 2D…
Improved Three-Dimensional Reconstructions in Electron Ptychography through Defocus Series Measurements
Marcel Schloz, Thomas C. Pekin, Hamish G. Brown +9
A detailed analysis of ptychography for 3D phase reconstructions of thick specimens is performed. We introduce multi-focus ptychography, which incorporates a 4D-STEM defocus series…
Iterative Phase Retrieval Algorithms for Scanning Transmission Electron Microscopy
Georgios Varnavides, Stephanie M. Ribet, Steven E. Zeltmann +7
Scanning transmission electron microscopy (STEM) has been extensively used for imaging complex materials down to atomic resolution. The most commonly employed STEM modality, annula…