collaborators

1 paper

physics.ins-det2016

Heavy Ion Induced SEU Sensitivity Evaluation of 3D Integrated SRAMs

Xuebing Cao, Liyi Xiao, Mingxue Huo +4

Heavy ions induced single event upset (SEU) sensitivity of three-dimensional integrated SRAMs are evaluated by using Monte Carlo sumulation methods based on Geant4. The cross secti…