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20012008
most citedPath to finding the critical thickness for memory in thin ferroelectric films

2 citations · 3 across the 5 of their papers we have counts for

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Showing 2004 · cond-mat.mtrl-sciShow all

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cond-mat.mtrl-sci2004

Smearing of phase transition due to surface effect in ferroelectric nanostructures

A. M. Bratkovsky, A. P. Levanyuk

The boundary conditions, customarily used in the Landau-type approach to ferroelectric thin films and nanostructures, have to be modified to take into account that a surface of a f…