3 citations · 3 across the 2 of their papers we have counts for
2 papers
physics.app-ph2022★ 3 cited
Non-destructive Depth-Resolved Characterization of Residual Strain Fields in High Electron Mobility Transistors using Differential Aperture X-ray Microscopy
Darren C. Pagan, Md Abu Jafar Rasel, Rachel E. Lim +3
Localized residual stress and elastic strain concentrations in microelectronic devices often affect the electronic performance, resistance to thermomechanical damage, and, likely,…
cond-mat.mes-hall2016
Evidence of Ballistic Thermal Transport in Lithium Niobate at Room Temperature
R. A. Pulavarthy, M. A. Haque
In ballistic transport, heat carriers such as phonons travel through the solid without any scattering or interaction. Therefore, there is no temperature gradient in the solid, whic…