most citedRealistic inversion of diffraction data for an amorphous solid: the case of amorphous silicon

24 citations · 24 across the 1 of their papers we have counts for

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cond-mat.mtrl-sci2016★ 24 cited

Realistic inversion of diffraction data for an amorphous solid: the case of amorphous silicon

Anup Pandey, Parthapratim Biswas, Bishal Bhattarai +1

We apply a new method "force enhanced atomic refinement" (FEAR) to create a computer model of amorphous silicon (a-Si), based upon the highly precise X-ray diffraction experiments…