87 citations · 113 across the 2 of their papers we have counts for
2 papers
cond-mat.mtrl-sci2016★ 26 cited
Buffer Layer Engineering on Graphene via Various Oxidation Methods for Atomic Layer Deposition
Nobuaki Takahashi, Kosuke Nagashio
The integration of high-k oxide on graphene using atomic layer deposition requires an electrically reliable buffer layer. In this study, Y was selected as the buffer layer due to t…
cond-mat.mtrl-sci2016★ 87 cited
Anisotropic Dielectric Breakdown Strength of Single Crystal Hexagonal Boron Nitride
Yoshiaki Hattori, Takashi Taniguchi, Kenji Watanabe +1
Dielectric breakdown has historically been of great interest from the perspectives of fundamental physics and electrical reliability. However, to date, the anisotropy in the dielec…