2 papers
cs.CV2025
Exploring "Many in Few" and "Few in Many" Properties in Long-Tailed, Highly-Imbalanced IC Defect Classification
Hao-Chiang Shao, Chun-Hao Chang, Yu-Hsien Lin +3
Despite significant advancements in deep classification techniques and in-lab automatic optical inspection models for long-tailed or highly imbalanced data, applying these approach…
cs.CV2024
LithoHoD: A Litho Simulator-Powered Framework for IC Layout Hotspot Detection
Hao-Chiang Shao, Guan-Yu Chen, Yu-Hsien Lin +4
Recent advances in VLSI fabrication technology have led to die shrinkage and increased layout density, creating an urgent demand for advanced hotspot detection techniques. However,…