most citedStrain in epitaxial MnSi films on Si(111) in the thick film limit studied by polarization-dependent extended x-ray absorption fine structure

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cond-mat.mtrl-sci2016★ 18 cited

Strain in epitaxial MnSi films on Si(111) in the thick film limit studied by polarization-dependent extended x-ray absorption fine structure

A. I. Figueroa, S. L. Zhang, A. A. Baker +7

We report a study of the strain state of epitaxial MnSi films on Si(111) substrates in the thick film limit (100-500~Å) as a function of film thickness using polarization-dependent…