8 citations · 17 across the 4 of their papers we have counts for
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cond-mat.mtrl-sci2023★ 8 cited
Morphology and Optical Properties of Thin Cd3As2 Films of a Dirac Semimetal Compound
Natalia Kovaleva, Ladislav Fekete, Dagmar Chvostova +1
Using atomic-force microscopy (AFM) and wide-band (0.02-8.5 eV) spectroscopic ellipsometry techniques we investigated morphology and optical properties of Cd3As2 films grown by non…
cond-mat.mtrl-sci2023★ 6 cited
Bismuth layer properties in the ultrathin Bi-FeNi multilayer films probed by spectroscopic ellipsometry
N. N. Kovaleva, D. Chvostova, O. Pacherova +6
Using wide-band (0.5-6.5 eV) spectroscopic ellipsometry we study ultrathin [Bi(0.6-2.5 nm)-FeNi(0.8,1.2 nm)]N multilayer films grown by rf sputtering deposition, where the FeNi lay…