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researcher

E. Abramof

5 papers here

Matching runs newest-first, so older work may not be attached to this profile yet.

author position
  • middle author1
  • last author4

Across the 5 of 5 papers where every author was matched, so the position is known.

fields
  • cond-mat.mtrl-sci4
  • physics.app-ph1
ORCID 0000-0001-7560-7470

identity via Semantic Scholar / OpenAlex

activity
20162020
most citedNanoscale characterization of bismuth telluride epitaxic layers by advanced X-ray analysis

1 citations · 1 across the 5 of their papers we have counts for

collaborators
Showing 2016Show all

1 paper · 1 filter

cond-mat.mtrl-sci2016★ 1 cited

Nanoscale characterization of bismuth telluride epitaxic layers by advanced X-ray analysis

Sérgio L. Morelhão, Celso I. Fornari, Paulo H. O. Rappl +1

Topological insulator surface properties are strongly correlated to structural properties, requiring high-resolution techniques capable of probing both surface and bulk structures…

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Not affiliated with arXiv. Researcher data from Semantic Scholar (ODC-BY) and OpenAlex.