Delay Time Characterization on FPGA: A Low Nonlinearity, Picosecond Resolution Time-to-Digital Converter on 16-nm FPGA using Bin Sequence Calibration

Sunwoo Park, Byungkwon Park, Eunsung Kim +3

We present a Time-to-Digital Converter (TDC) implemented on a 16 nm Xilinx UltraScale Plus FPGA that achieves a resolution of 1.15 ps, RMS precision of 3.38 ps, a differential nonl…