2 papers
physics.ins-det2025
Robust electron counting for direct electron detectors with the Back-Propagation Counting method
Joshua Renner, Matthew A. Wright, Kristofer Bouchard +6
Electron microscopy (EM) is a foundational tool for directly assessing the structure of materials. Recent advances in direct electron detectors have improved signal-to noise ratios…
cond-mat.mtrl-sci2024
Mapping electron beam-induced radiolytic damage in molecular crystals
Ambarneil Saha, Matthew Mecklenburg, Alexander J. Pattison +3
Every electron crystallography experiment is fundamentally limited by radiation damage. Nevertheless, little is known about the onset and progression of radiolysis in beam-sensitiv…