2 papers
physics.ins-det2025
Robust electron counting for direct electron detectors with the Back-Propagation Counting method
Joshua Renner, Matthew A. Wright, Kristofer Bouchard +6
Electron microscopy (EM) is a foundational tool for directly assessing the structure of materials. Recent advances in direct electron detectors have improved signal-to noise ratios…
physics.optics2024
Intrinsic Optical Bistability of Photon Avalanching Nanocrystals
Artiom Skripka, Zhuolei Zhang, Xiao Qi +6
Optically bistable materials respond to a single input with two possible optical outputs, contingent upon excitation history. Such materials would be ideal for optical switching an…