2 papers
cs.AR2025
Analysis of Single Event Induced Bit Faults in a Deep Neural Network Accelerator Pipeline
Naïn Jonckers, Toon Vinck, Peter Karsmakers +1
In recent years, the increased interest and the growth in application domains of Artificial Intelligence (AI), and more specifically Deep Neural Networks (DNNs), has led to an exte…
cs.LG2025
Mitigating multiple single-event upsets during deep neural network inference using fault-aware training
Toon Vinck, Naïn Jonckers, Gert Dekkers +2
Deep neural networks (DNNs) are increasingly used in safety-critical applications. Reliable fault analysis and mitigation are essential to ensure their functionality in harsh envir…