2 papers
cs.AR2025
STAR: Improving Lifetime and Performance of High-Capacity Modern SSDs Using State-Aware Randomizer
Omin Kwon, Kyungjun Oh, Jaeyong Lee +2
Although NAND flash memory has achieved continuous capacity improvements via advanced 3D stacking and multi-level cell technologies, these innovations introduce new reliability cha…
cs.AR2025
STRAW: A Stress-Aware WL-Based Read Reclaim Technique for High-Density NAND Flash-Based SSDs
Myoungjun Chun, Jaeyong Lee, Inhyuk Choi +3
Although read disturbance has emerged as a major reliability concern, managing read disturbance in modern NAND flash memory has not been thoroughly investigated yet. From a device…