activity
20162026
most citedTransverse momentum spectra and nuclear modification factors of charged particles in pp, p-Pb and Pb-Pb collisions at the LHC

207 citations · 2.1k across the 61 of their papers we have counts for

collaborators
Showing 2024Show all

6 papers · 1 filter

hep-ex2024★ 1 cited

First results on new helium based eco-gas mixtures for the Extreme Energy Events Project

M. Abbrescia, C. Avanzini, L. Baldini +58

The Extreme Energy Events (EEE) Project, a joint project of the Centro Fermi (Museo Storico della Fisica e Centro Studi e Ricerche "E.Fermi") and INFN, has a dual purpose: a scient…

nucl-ex2024★ 2 cited

Measurement of the inclusive isolated-photon production cross section in pp and PbPb collisions at TeV

ALICE Collaboration

The ALICE Collaboration at the CERN LHC has measured the inclusive production cross section of isolated photons at midrapidity as a function of the photon transverse momentum ($p_{…

physics.ins-det2024★ 5 cited

Time performance of Analog Pixel Test Structures with in-chip operational amplifier implemented in 65 nm CMOS imaging process

Gianluca Aglieri Rinella, Luca Aglietta, Matias Antonelli +43

In the context of the CERN EP R&D on monolithic sensors and the ALICE ITS3 upgrade, the Tower Partners Semiconductor Co (TPSCo) 65 nm process has been qualified for use in high ene…

hep-ex2024★ 3 cited

Measurement of the inclusive isolated-photon production cross section in pp collisions at = 13 TeV

ALICE Collaboration

The production cross section of inclusive isolated photons has been measured by the ALICE experiment at the CERN LHC in pp collisions at centre-of-momentum energy of …

physics.ins-det2024★ 12 cited

First results on monolithic CMOS detector with internal gain

U. Follo, G. Gioachin, C. Ferrero +19

In this paper we report on a set of characterisations carried out on the first monolithic LGAD prototype integrated in a customised 110 nm CMOS process having a depleted active vol…

physics.ins-det2024

Characterisation of analogue Monolithic Active Pixel Sensor test structures implemented in a 65 nm CMOS imaging process

Gianluca Aglieri Rinella, Giacomo Alocco, Matias Antonelli +91

Analogue test structures were fabricated using the Tower Partners Semiconductor Co. CMOS 65 nm ISC process. The purpose was to characterise and qualify this process and to optimise…