activity
20132026
most citedSilicon-carbon bond inversions driven by 60 keV electrons in graphene

150 citations · 1.3k across the 37 of their papers we have counts for

collaborators
Showing 2018Show all

6 papers · 1 filter

cond-mat.mes-hall2018

Scanning transmission electron microscopy under controlled low-pressure atmospheres

Gregor T. Leuthner, Stefan Hummel, Clemens Mangler +4

Transmission electron microscopy (TEM) is carried out in vacuum to minimize the interaction of the imaging electrons with gas molecules while passing through the microscope column.…

physics.app-ph2018★ 16 cited

Direct visualization of the 3D structure of silicon impurities in graphene

Christoph Hofer, Viera Skakalova, Mohammad Reza Ahmadpour Monazam +4

We directly visualize the three-dimensional (3D) geometry and dynamics of silicon impurities in graphene as well as their dynamics by aberration-corrected scanning transmission ele…

cond-mat.mtrl-sci2018★ 22 cited

Intrinsic core level photoemission of suspended graphene

Toma Susi, Mattia Scardamaglia, Kimmo Mustonen +11

X-ray photoelectron spectroscopy of graphene is important both for its characterization and as a model for other carbon materials. Despite great recent interest, the intrinsic phot…

physics.app-ph2018

Revealing the 3D Structure of Graphene Defects

Christoph Hofer, Christian Kramberger, Mohammad Reza Ahmadpour Monazam +5

We demonstrate insights into the three-dimensional structure of defects in graphene, in particular grain boundaries, obtained via a new approach from two transmission electron micr…

cond-mat.mtrl-sci2018★ 10 cited

Structure evolution of hcp/ccp metal oxide interfaces in solid-state reactions

C. Li, G. Habler, T. Griffiths +7

The structure of crystalline interfaces plays an important role in solid-state reactions. The Al2O3/MgAl2O4/MgO system provides an ideal model system for investigating the mechanis…

cond-mat.mtrl-sci2018★ 15 cited

Automated image acquisition for low-dose STEM at atomic resolution

Andreas Mittelberger, Christian Kramberger, Christoph Hofer +2

Beam damage is a major limitation in electron microscopy that becomes increasingly severe at higher resolution. One possible route to circumvent radiation damage, which forms the b…