2 papers
cond-mat.mtrl-sci2025
The Microscopic Structure of Stacking Faults in SrNaNbO
Robin Sjökvist, Yining Xie, Zabeada Aslam +4
Stacking faults and other topological defects in ferroics can have a significant influence on the electronic and mechanical properties of the material. Here, regular stacking fault…
physics.ins-det2025
Template masks for 4D-STEM
Yining Xie, Eoin Moynihan, Marin Alexe +3
We present a new analysis method for atomic resolution four-dimensional scanning transmission electron microscopy (4D-STEM, in which a diffraction pattern is collected at each poin…