143 citations · 301 across the 22 of their papers we have counts for
1 paper · 1 filter
M. Dai, W. Guo, X. Liu +8
We deposit thin titanium-nitride (TiN) and TiN/Ti/TiN multilayer films on sapphire substrates and measure the reflectance and transmittance in the wavelength range from 400 nm to 2…