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M. Padilla

14 papers hereh-index 12308 citations36 works total

Matching runs newest-first, so older work may not be attached to this profile yet.

author position
  • first author2
  • middle author10
  • last author2

Across the 14 of 14 papers where every author was matched, so the position is known.

fields
  • physics.optics7
  • eess.SP5
  • physics.ins-det2
same name
  • M. Padilla — 98 papers
  • M. Padilla — 51 papers, h 34
  • M. Padilla — 2 papers
  • M. Padilla — 2 papers
  • M. Padilla — 1 paper
  • M. Padilla — 1 paper, h 1

Either other researchers who publish under this name, or the same person where the external sources have not merged their records.

identity via Semantic Scholar / OpenAlex

activity
20152023
most citedSuper-resolution far-ultraviolet equivalent-wavelength interferometry combining the phase of several visible-wavelength interferograms

62 citations · 305 across the 13 of their papers we have counts for

collaborators
Showing 2017 · physics.opticsShow all

3 papers · 2 filters

physics.optics2017★ 62 cited

Super-resolution far-ultraviolet equivalent-wavelength interferometry combining the phase of several visible-wavelength interferograms

Manuel Servin, Moises Padilla, Guillermo Garnica

A far-ultraviolet (FUV) equivalent-wavelength super-resolution interferometric technique is proposed. This FUV equivalent-wavelength interferometric method combines four demodulate…

physics.optics2017★ 62 cited

Extended depth-range profilometry using the phase-difference and phase-sum of two close-sensitivity projected fringes

Manuel Servin, Moises Padilla, Guillermo Garnica

We propose a high signal-to-noise extended depth-range three-dimensional (3D) profilometer projecting two linear-fringes with close phase-sensitivity. We use temporal phase-shiftin…

physics.optics2017

Temporal-multiplexing interferometry applied to co-phased profilometry

Manuel Servin, Moises Padilla, Guillermo Garnica

Fringe-projection profilometry with 1 camera and 1 fringe-projector is a well-known and widely used technique in optical metrology. Spatial-frequency multiplexing interferometry wi…

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