activity
20152025
most citedRole of ferroelectric polarization during growth of highly strained ferroelectrics revealed by in-situ x-ray diffraction

32 citations · 75 across the 10 of their papers we have counts for

collaborators

10 papers

cond-mat.mtrl-sci2025

Detachment limited interlayer transport processes during SrTiO3 pulsed laser epitaxy

Jeffrey G. Ulbrandt, Xiaozhi Zhang, Randall L. Headrick

Pulsed laser epitaxial growth is characterized by high instantaneous deposition rates that leads to the nucleation of transient islands, both on surface terraces, and on top of sta…

cond-mat.mtrl-sci2023

Local step-flow dynamics in thin film growth with desorption

Xiaozhi Zhang, Jeffrey G. Ulbrandt, Peco Myint +6

Desorption of deposited species plays a role in determining the evolution of surface morphology during crystal growth when the desorption time constant is short compared to the tim…

cond-mat.mtrl-sci2021

Early Stage Growth of Amorphous Thin Film: Average Kinetics, Nanoscale Dynamics and Pressure Dependence

Chenyu Wang, Karl F. Ludwig, Christa Wagenbach +5

We used the Coherent Grazing Incidence Small Angle X-Ray Scattering (Co-GISAXS) technique to study the average kinetics and nanoscale dynamics during early-stage a-WSi sputter…

cond-mat.mtrl-sci2019★ 32 cited

Role of ferroelectric polarization during growth of highly strained ferroelectrics revealed by in-situ x-ray diffraction

Rui Liu, Jeffrey G. Ulbrandt, Hsiang-Chun Hsing +11

Strain engineering of perovskite oxide thin films has proven to be an extremely powerful method for enhancing and inducing ferroelectric behavior. In ferroelectric thin films and s…

cond-mat.mtrl-sci2019★ 5 cited

Homoepitaxial growth of SrTiO by Pulsed Laser Deposition: energetic vs thermal growth

Jeffrey G. Ulbrandt, Xiaozhi Zhang, Rui Liu +3

Pulsed Laser Deposition (PLD) is widely used to grow epitaxial thin films of quantum materials such as complex oxides. Here, we use in-situ X-ray scattering to study homoepitaxy of…

cond-mat.mtrl-sci2018★ 24 cited

Coherent X-ray measurement of step-flow propagation during growth on polycrystalline thin film surfaces

Randall L. Headrick, Jeffrey G. Ulbrandt, Peco Myint +6

The properties of artificially grown thin films are strongly affected by surface processes during growth. Coherent X-rays provide an approach to better understand such processes an…

cond-mat.mtrl-sci2016

Ballistic Deposition of Nanoclusters

Jeffrey G. Ulbrandt, Yang Li, Randall L. Headrick

Nanoporous thin-films are an important class of materials, offering a way to observe fundamental surface and bulk processes with particles larger than individual atoms, but small e…

cond-mat.mtrl-sci2015

Transient phases during fast crystallization of organic thin films from solution

Jing Wan, Yang Li, Jeffrey G. Ulbrandt +4

We report an in-situ microbeam grazing incidence X-ray scattering study of 2,7-dioctyl[1]benzothieno[3,2-b][1]benzothiophene (C-BTBT) organic semiconductor thin film deposition…

cond-mat.mtrl-sci2015★ 13 cited

Co-GISAXS as a New Technique to Investigate Surface Growth Dynamics

Meliha G. Rainville, Christa Hoskin, Jeffrey G. Ulbrandt +5

Detailed quantitative measurement of surface dynamics during thin film growth is a major experimental challenge. Here X-ray Photon Correlation Spectroscopy with coherent hard X-ray…

cond-mat.mtrl-sci2015★ 1 cited

Using coherent X-rays to directly measure the propagation velocity of defects during thin film deposition

Jeffrey G. Ulbrandt, Meliha G. Rainville, Christa Hoskin +5

The properties of artificially grown thin films are often strongly affected by the dynamic relationship between surface growth processes and subsurface structure. Coherent mixing o…