2 papers
cond-mat.mes-hall2025
STEM EBIC as a Quantitative Probe of Semiconductor Devices
Sebastian Schneider, Sebastian Beckert, René Hammer +3
Electron beam-induced current (EBIC) imaging in the scanning transmission electron microscope (STEM), STEM-EBIC, provides direct access to carrier transport at the nanoscale. While…
cond-mat.mtrl-sci2025
DNA mold-based fabrication of continuous silver nanostructures
Christoph Hadlich, Borja Rodriguez-Barea, Darius Pohl +3
Bottom-up fabrication of inorganic nanostructures is emerging as an alternative to classical top-down approaches, offering precise nanometer-scale control at relatively low cost an…