most citedOn-the-fly Data Assessment for High Throughput X-ray Diffraction Measurement

23 citations · 32 across the 3 of their papers we have counts for

collaborators

5 papers

cond-mat.mtrl-sci201723 cited

On-the-fly Data Assessment for High Throughput X-ray Diffraction Measurement

Fang Ren, Ronald Pandolfi, Douglas Van Campen +2

Investment in brighter sources and larger and faster detectors has accelerated the speed of data acquisition at national user facilities. The accelerated data acquisition offers ma…

cond-mat.mtrl-sci20171 cited

On-the-fly Segmentation Approaches for X-ray Diffraction Datasets for Metallic Glasses

Fang Ren, Travis Williams, Jason Hattrick-Simpers +1

Investment in brighter sources and larger detectors has resulted in an explosive rise in the data collected at synchrotron facilities. Currently, human experts extract scientific i…

cond-mat.mtrl-sci20178 cited

Crystal truncation rods from miscut surfaces

Trevor A Petach, Apurva Mehta, Michael F Toney +1

Crystal truncation rods are used to study surface and interface structure. Since real surfaces are always somewhat miscut from a low index plane, it is important to study the effec…

cond-mat.mtrl-sci2016

Mechanism for the Large Conductance Modulation in Electrolyte-gated Thin Gold Films

Trevor A Petach, Menyoung Lee, Ryan Davis +2

Electrolyte gating using ionic liquid electrolytes has recently generated considerable interest as a method to achieve large carrier density modulations in a variety of materials.…

cond-mat.mtrl-sci2016

Voltage Controlled Interfacial Layering in an Ionic Liquid on SrTiO

Trevor A Petach, Apurva Mehta, Ronald Marks +3

One prominent structural feature of ionic liquids near surfaces is formation of alternating layers of anions and cations. However, how this layering responds to applied potential i…