46 citations · 149 across the 11 of their papers we have counts for
3 papers · 1 filter
Non-destructive Depth-Resolved Characterization of Residual Strain Fields in High Electron Mobility Transistors using Differential Aperture X-ray Microscopy
Darren C. Pagan, Md Abu Jafar Rasel, Rachel E. Lim +3
Localized residual stress and elastic strain concentrations in microelectronic devices often affect the electronic performance, resistance to thermomechanical damage, and, likely,…
Digital autofocusing of a coded-aperture Laue diffraction microscope
Doga Gursoy, Dina Sheyfer, Michael Wojcik +2
To provide optimal depth resolution with a coded-aperture Laue diffraction microscope, an accurate position of the coded-aperture and its scanning geometry need to be known. Howeve…
Refinements for Bragg coherent X-ray diffraction imaging: Electron backscatter diffraction alignment and strain field computation
David Yang, Mark T. Lapington, Guanze He +8
Bragg coherent X-ray diffraction imaging (BCDI) allows the three-dimensional (3D) measurement of lattice strain along the scattering vector for specific microcrystals. If at least…