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20132023
most citedNano-scale imaging of the full strain tensor of specific dislocations extracted from a bulk sample

46 citations · 149 across the 11 of their papers we have counts for

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Showing 2017 · cond-mat.mtrl-sciShow all

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cond-mat.mtrl-sci2017

Glancing-Incidence Focussed Ion Beam Milling: A Coherent X-ray Diffraction Study of 3D Nano-scale Lattice Strains and Crystal Defects

Felix Hofmann, Ross J. Harder, Wenjun Liu +3

This study presents a detailed examination of the lattice distortions introduced by glancing incidence Focussed Ion Beam (FIB) milling. Using non-destructive multi-reflection Bragg…