activity
20132021
most citedExpansion and fragmentation of liquid metal droplet by a short laser pulse

47 citations · 129 across the 6 of their papers we have counts for

collaborators

6 papers

physics.plasm-ph2021

Miniature Plasma Source for In-Situ Scanner Cleaning

Mark van de Kerkhof, Edgar Osorio, Vladimir Krivtsun +3

EUV Lithography is the technology of choice for High-Volume Manufacturing (HVM) of sub-10nm lithography. One of the challenges is to enable in-situ cleaning of functional surfaces…

physics.comp-ph2018★ 47 cited

Expansion and fragmentation of liquid metal droplet by a short laser pulse

S. Yu. Grigoryev, B. V. Lakatosh, M. S. Krivokorytov +11

We report an experimental and numerical investigation of the fragmentation mechanisms of micrometer-sized metal droplet irradiated by ultrashort laser pulses. The results of the ex…

physics.plasm-ph2016

Droplet deformation and fragmentation by ultra-short laser pulses

M. S. Krivokorytov, A. Yu. Vinokhodov, Yu. V. Sidelnikov +5

We report on the experimental studies of the deformation and fragmentation of liquid metal droplets by picosecond and subpicosecond laser pulses. The experiments were performed wit…

physics.plasm-ph2014★ 10 cited

Plasma probe characteristics in low density hydrogen pulsed plasmas

D. I. Astakhov, W. J. Goedheer, C. J. Lee +6

Probe theories are only applicable in the regime where the probe's perturbation of the plasma can be neglected. However, it is not always possible to know, a priori, that a particu…

physics.plasm-ph2014★ 25 cited

Discharge-produced plasma extreme ultraviolet (EUV) source and ultra high vacuum chamber for studying EUV-induced processes

A Dolgov, O Yakushev, A Abrikosov +4

An experimental setup that directly reproduces Extreme UV-lithography relevant conditions for detailed component exposure tests is described. The EUV setup includes a pulsed plasma…

physics.plasm-ph2013★ 47 cited

Comparison of H2 and He carbon cleaning mechanisms in extreme ultraviolet induced and surface wave discharge plasmas

A Dolgov, D Lopaev, T Rachimova +6

Cleaning of contamination of optical surfaces by amorphous carbon (a-C) is highly relevant for extreme ultraviolet (EUV) lithography. We have studied the mechanisms for a-C removal…