Optical shape analysis based on discrete Fourier transform and second order moment calculation of the brightness distribution for the detection of sub-micron range low energy tracks

Atsuhiro Umemoto, Tatsuhiro Naka, Toshiyuki Nakano +3

To recognize sub-micron range low energy tracks recorded in a super fine grained nuclear emulsion (Nano Imaging Tracker), an elliptical fitting method was devised to analyze anisot…