collaborators

1 paper

cs.ET2016

Enhanced Circuit Densities in Epitaxially Defined FinFETs (EDFinFETs) over FinFETs

Sushant Mittal, Aneesh Nainani, M. C. Abraham +2

FinFET technology is prone to suffer from Line Edge Roughness (LER) based VT variation with scaling. To address this, we proposed an Epitaxially Defined (ED) FinFET (EDFinFET) as a…