most citedAn X-Band Waveguide Measurement Technique for the Accurate Characterization of Materials with Low Dielectric Loss Permittivity

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physics.ins-det2016★ 23 cited

An X-Band Waveguide Measurement Technique for the Accurate Characterization of Materials with Low Dielectric Loss Permittivity

Kenneth W. Allen, Mark M. Scott, David R. Reid +4

In this work, we present a new X-band waveguide (WR90) measurement method that permits the broadband characterization of the complex permittivity for low dielectric loss tangent ma…