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physics.ins-det2023
Characterization, Simulation and Test Beam Data Analysis of Stitched Passive CMOS Strip Sensors
I. Zatocilova, J. -H. Arling, M. Baselga +19
In the passive CMOS Strips Project, strip sensors were designed at the University of Bonn and produced by LFoundry in 150 nm technology, with an additional backside processing from…
physics.ins-det2023★ 1 cited
Understanding the Frequency Dependence of Capacitance Measurements of Irradiated Silicon Detectors
Sven Mägdefessel, Riccardo Mori, Niels Sorgenfrei +1
Capacitance-voltage (CV) measurements are a widely used technique in silicon detector physics. It gives direct information about the full depletion voltage and the effective doping…