16 citations · 16 across the 2 of their papers we have counts for
4 papers · 1 filter
Amplitude dependence of resonance frequency and its consequences for scanning probe microscopy
Omur E. Dagdeviren, Yoichi Miyahara, Aaron Mascaro +2
With recent advances in scanning probe microscopy (SPM), it is now routine to determine the atomic structure of surfaces and molecules while quantifying the local tip-sample intera…
Limit of Temporal Resolution in Atomic Force Microscopy: How fast can we image with atomically-engineered tips while preserving picometer range spatial resolution?
Omur E. Dagdeviren
With recent advances in dynamic scanning probe microscopy techniques, it is now a routine to image the sub-molecular structure of molecules with atomically-engineered tips which ar…
Calibration of the oscillation amplitude of electrically excited scanning probe microscopy sensors
Omur E. Dagdeviren, Yoichi Miyahara, Aaron Mascaro +1
Atomic force microscopy (AFM) is an analytical surface characterization tool which can reveal a sample's topography with high spatial resolution while simultaneously probing tip-sa…
Suppression of the Spectral Weight of Topological Surface States on the Nanoscale via Local Symmetry Breaking
Omur E. Dagdeviren, Subhasish Mandal, Ke Zou +7
In topological crystalline insulators the topological conducting surface states are protected by crystal symmetry, in principle making it possible to pattern nanoscale insulating a…