48 citations · 95 across the 10 of their papers we have counts for
5 papers · 1 filter
Direct Imaging, Three-dimensional Interaction Spectroscopy, and Friction Anisotropy of Atomic-scale Ripples on MoS
Omur E. Dagdeviren, Ogulcan Acikgoz, Peter Grutter +1
Theory predicts that two-dimensional (2D) materials may only exist in the presence of out-ofplane deformations on atomic length scales, frequently referred to as ripples. While suc…
Confronting Interatomic Force Measurements
Omur E Dagdeviren
The quantitative interatomic force measurements open a new pathway to materials characterization, surface science, and chemistry by elucidating the force between 'two' interacting…
Amplitude dependence of resonance frequency and its consequences for scanning probe microscopy
Omur E. Dagdeviren, Yoichi Miyahara, Aaron Mascaro +2
With recent advances in scanning probe microscopy (SPM), it is now routine to determine the atomic structure of surfaces and molecules while quantifying the local tip-sample intera…
Limit of Temporal Resolution in Atomic Force Microscopy: How fast can we image with atomically-engineered tips while preserving picometer range spatial resolution?
Omur E. Dagdeviren
With recent advances in dynamic scanning probe microscopy techniques, it is now a routine to image the sub-molecular structure of molecules with atomically-engineered tips which ar…
Calibration of the oscillation amplitude of electrically excited scanning probe microscopy sensors
Omur E. Dagdeviren, Yoichi Miyahara, Aaron Mascaro +1
Atomic force microscopy (AFM) is an analytical surface characterization tool which can reveal a sample's topography with high spatial resolution while simultaneously probing tip-sa…