most citedTwo competing interpretations of Kelvin Probe Force Microscopy on semiconductors put to test

27 citations · 27 across the 1 of their papers we have counts for

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cond-mat.mtrl-sci2016★ 27 cited

Two competing interpretations of Kelvin Probe Force Microscopy on semiconductors put to test

Leo Polak, Rinke J. Wijngaarden

Kelvin probe force microscopy (KPFM) is a popular tool for studying properties of semiconductors. However, the interpretation of its results is complicated by the possibility of so…