most citedApplication of Convolutional Neural Network to TSOM Images for Classification of 6 nm Node Patterned Defects

1 citations · 1 across the 2 of their papers we have counts for

collaborators

2 papers

cond-mat.mes-hall2022★ 1 cited

Application of Convolutional Neural Network to TSOM Images for Classification of 6 nm Node Patterned Defects

Ravikiran Attota

With the rapid growth in the semiconductor industry, it is becoming critical to detect and classify increasingly smaller patterned defects. Recently machine learning, including dee…

cond-mat.mes-hall2016

A Better Method for Volume Determination of Regularly and Irregularly Shaped Nanoparticles with Enhanced Accuracy

Ravi Kiran Attota

Nanoparticles (NPs) are widely used in diverse application areas, such as medicine, engineering, and cosmetics. The size (or volume) of NPs is one of the most important parameters…