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stat.AP2022
Robust estimation based on one-shot device test data under log-normal lifetimes
N. Balakrishnan, E. Castilla
In this paper we present robust estimators for one-shot device test data under lognormal lifetimes. Based on these estimators, confidence intervals and Wald-type tests are also dev…
stat.ME2022
Robust inference for non-destructive one-shot device testing under step-stress model with exponential lifetimes
Narayanaswamy Balakrishnan, Elena Castilla, María Jaenada +1
One-shot devices analysis involves an extreme case of interval censoring, wherein one can only know whether the failure time is either before or after the test time. Some kind of o…